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EVOKED POTENTIAL MEASURING APPARATUS
专利权人:
NIHON KOHDEN CORPORATION
发明人:
Akira HYODO
申请号:
US15436910
公开号:
US20170245775A1
申请日:
2017.02.20
申请国别(地区):
US
年份:
2017
代理人:
摘要:
An evoked potential measuring apparatus includes: an evoked potential acquiring section which is configured to acquire a plurality of evoked potential waveforms from a subject in response to stimulation; an average processing section which is configured to arithmetically average the plurality of evoked potential waveforms to acquire an average waveform; a first statistical value calculator which, each time a waveform set including an N (N is 2 or more) number of evoked potential waveforms is acquired, is configured to calculate a first statistical value of the waveform set; and an updation processing section which is configured to update the average waveform to eliminate a waveform set in which the first statistical value exceeds a first threshold, from the arithmetic average.
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