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OPTOMETRY APPARATUS AND OPTOMETRY PROGRAM
专利权人:
LTD.;NIDEK CO.
发明人:
Michihiro TAKII,Noriji KAWAI,Taeko HORINO,Hisashi OCHI,Kazunori SHIBATA
申请号:
US15710202
公开号:
US20180078135A1
申请日:
2017.09.20
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An optometry apparatus includes: an optical characteristic measurement device configured to measure an optical characteristic of right and left subject eyes in a both-eye opened state by projecting a visual target onto the subject eyes; an anterior ocular segment acquisition device configured to acquire anterior ocular segment images of the right and left subject eyes by the optical characteristic measurement device during the measurement of the optical characteristic of the subject eye in the both-eye opened state; and a controller configured to execute: an analysis instruction for performing analysis processing on the anterior ocular segment images acquired by the anterior ocular segment acquisition device to acquire both-eye opened state information; a determination instruction for determining whether the both-eye opened state information acquired by the analysis instruction is favorable or not, to acquire determination information; and an output instruction for outputting the determination information acquired by the determination instruction.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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