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专利权人:
富士フイルム株式会社
发明人:
寺村 友一,渡邊 大祐
申请号:
JP2008172964
公开号:
JP5247264B2
申请日:
2008.07.02
申请国别(地区):
JP
年份:
2013
代理人:
摘要:

PROBLEM TO BE SOLVED: To realize a calibrating jig having simplicity and reproducibility and capable of calibrating a probe type optical tomographic imaging apparatus equipped with an optical probe, having a mounting part on which the optical probe is mounted, emitting light to split it into reference light and measuring light, emitting measuring light from the emitting part of the mounting part, irradiating a measuring target from the optical probe, guiding the reflected light from the measuring target by the optical probe to combine it with the reference light and detecting the coherent light when combination as a coherent signal to obtain the tomographic image of the measuring target.

SOLUTION: The calibrating jig 1 is equipped with the holding member 2 capable of being mounted on the mounting part 101 of the optical tomographic imaging apparatus 100 in a freely detachable manner and the reflecting surface 3a held to the holding member 2 and reflecting the measuring light L1 emitted from an emitting part 101a to make the reflected light thereof enter the emitting part 101a.

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