您的位置: 首页 > 农业专利 > 详情页

光断層画像化システム
专利权人:
富士フイルム株式会社
发明人:
井上 敏之
申请号:
JP2008001079
公开号:
JP4986296B2
申请日:
2008.01.08
申请国别(地区):
JP
年份:
2012
代理人:
摘要:
In optical tomography measurement using light, the wavelength of which is periodically swept, interference light between reflection light and reference light is split into first interference light and second interference light by a light splitting means. The optical path length of the first interference light and that of the second interference light are adjusted by an interference-light optical path length adjustment means so that they become the same. Further, balanced detection is performed on the first interference light and the second interference light by an interference light detection means.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充