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超音波探触子及び超音波診断装置
专利权人:
株式会社日立製作所
发明人:
田中 宏樹,鱒沢 裕
申请号:
JP2014550871
公开号:
JP6085614B2
申请日:
2012.12.07
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
An ultrasonic probe includes a plurality of ultrasonic transducers. The ultrasonic probe is connected to a reception system circuit including at least one first delay adder circuit in which a predetermined number among the plurality of ultrasonic transducers is configured as one subarray and delaying and adding are performed in subarray units with respect to an ultrasonic wave reception signal that is acquired from the ultrasonic transducers included in the subarray, and a second delay adder circuit in which delaying and adding are performed with respect to the ultrasonic wave reception signal that is acquired from the ultrasonic transducers. The plurality of ultrasonic transducers include a first group which transmits the reception signal to the second delay adder circuit passing through the first delay adder circuit and a second group which transmits the reception signal directly to the second delay adder circuit without passing through the first delay adder circuit.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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