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MEASURING APPARATUS AND MEASURING METHOD
专利权人:
FUJITSU LIMITED
发明人:
Yosuke YOKOTA,Musashi TSUDA,KAZUO IKEMOTO,Hiroshi Hidaka,Akira Itasaki,Shinobu KOTANI,Daisuke Endo,Asako Okazaki,Kazushi OKADA,TETSUYA SASAKI,Hirofumi TSUJIMURA,Wataru HOSHII
申请号:
US15262141
公开号:
US20170115157A1
申请日:
2016.09.12
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A measuring apparatus includes a memory configured to store a program, and a processor configured to execute the program and perform a process including acquiring a first measured value from a first sensor that measures a weight of a subject, judging whether the first measured value satisfies a condition in which a change in the first measured value within a predetermined time is a threshold value or less, acquiring a second measured value from a second sensor that is other than the first sensor and detects biometric information of the subject other than the weight, in a case in which the judging judges that the first measured value satisfies the condition, and recording the first measured value satisfying the condition and the second measured value in correspondence with each other.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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