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MEASURING APPARATUS AND METHOD THEREOF
专利权人:
发明人:
Seiji Funaya,Koji Miyama,Yasuyo Saito,Masafumi Ogasawara
申请号:
US14066507
公开号:
US20140119610A1
申请日:
2013.10.29
申请国别(地区):
US
年份:
2014
代理人:
摘要:
A measuring apparatus is provided. The measuring apparatus includes a first region of interest setting unit configured to set first regions of interest to a target for observation, a second region of interest setting unit configured to set a second region of interest to a part not including the first regions of interest, a first moving vector calculating unit configured to calculate moving vectors of first parts of the first regions of interest, a second moving vector calculating unit configured to calculate a moving vector of a second part of the second region, and a corrected moving vector calculating unit configured to perform a correction based on the moving vector of the second part on each of the moving vectors of the first parts to calculate a corrected moving vector.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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