Disclosed are a method and a system for correcting signals from a detector for X-ray detection. According to an embodiment, there is provided is a method for correcting signals from a detector for X-ray detection using a detector signal correcting system (10) comprising detector inspection equipment (100) and X-ray imaging equipment (200). The detector inspection equipment (100) comprises a first X-ray emitting portion (110) and a first microprocessor (120), and the X-ray imaging equipment (200) comprises a second X-ray emitting portion (210), a detector (D) to be corrected, and a second microprocessor (220). The correcting method comprises the steps of: (S10) acquiring a plurality of dark images with regard to the detector (D) by the first microprocessor (120) and calculating a signal standard deviation and a primary offset with regard to each pixel of the detector (D) (S20) selecting a first group of bad pixels (BP1) by the first microprocessor (120) on the basis of the signal standard deviation and the primary offset information (S30) acquiring a plurality of bright images with regard to the detector (D) by the first microprocessor (120) and calculating a secondary offset and a gain with regard to each pixel of the detector (D) (S40) selecting a second group of bad pixels (BP2) by the first microprocessor (120) on the basis of the secondary offset and the gain information (S50) correcting detection signals from respective pixels, which are obtained when the bright images are acquired, on the basis of the primary offset, the secondary offset, and the gain and selecting a third group of bad pixels (BP3) on the basis of the resulting corrected signal values by the first microprocessor (120), thereby completing a bad pixel map (BPM) and (S60) correcting signals from bad pixels using the bad pixel amp (BPM) by the second microprocessor (220) when an X-ray image of a subject is taken by the X-ray imaging equipment (200).La présente invention se rapporte à un procédé et
