The object of the present invention is to provide a method, system and apparatus that are capable of measuring magnetic characteristic of crystal grains composing magnetic polycrystalline materials in the magnetic field or nonmagnetic field by X-ray magnetic circular dichroism. In particular, the present invention is capable of measuring the magnetic characteristic of comparatively very thick materials having a thickness in the range from 50 to 1000 nm and prepared by fabricating microtome sections using focused ion beam etching.