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System and method for evaluating tissue
专利权人:
Wan Y. Shih
发明人:
Wan Y. Shih,Wei-Heng Shih,Hakki Yegingil,Ari D. Brooks
申请号:
US12992923
公开号:
US08562546B2
申请日:
2009.05.15
申请国别(地区):
US
年份:
2013
代理人:
摘要:
The present invention provides a sensor system for measuring an elastic modulus and a shear modulus and a method for using the sensor system to evaluate a tissue by determining the presence of and/or characterizing abnormal growths. The method involves applying a set of forces of different magnitudes to one or more locations of tissue, detecting the corresponding displacements due to said applied forces, determining the forces acting on those locations of tissue which are a combination of forces from the applied voltages and the countering forces from tissue deformation, obtaining the elastic modulus and/or shear modulus for a plurality of locations, and determining abnormal growth invasiveness, malignancy or the presence of a tumor from said elastic and/or shear moduli.
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