A method for processing an X-ray image of an object under examination taken with an X-ray detector with a plurality of pixel sensors is provided to remove bright-burn artifacts. At least one substantially artifact-free offset image of the X-ray detector without the application of X-rays is provided. At least one dark image with the X-ray detector without the application of X-rays is recorded. The at least one dark image is corrected by the at least one artifact-free offset image for determining at least one offset-corrected first correction image with afterglow artifacts. At least one second correction image for correcting bright-burn artifacts from the first correction image with afterglow artifacts is calculated using a, in particular predetermined, correlation between afterglow artifacts and bright-burn artifacts. At least one X-ray image of an object under examination is recorded with the X-ray detector, and the at least one X-ray image is corrected with the at least one second correction image to remove bright-burn artifacts.
