DEVICE AND METHOD FOR MEASURING PLANT GROWTH CONDITIONS

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专利权人:

发明人:

申请号：

EP14703819.4

公开号：

EP2953446A1

申请日:

2014.02.07

申请国别(地区):

EP

年份:

2015

代理人:

摘要：

A device (10) and method are provided for measuring the plant growth conditions within a substrate. A first and a second linear arrays of probes (16, 18) are used, allowing multiple measurements of properties of the substrate. Using multiple measurements at different levels in the substrate and then combining these multiple measurements, allows plant growth conditions to be accurately derived.

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