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ANALYZING GRID FOR PHASE CONTRAST IMAGING AND/OR DARK-FIELD IMAGING
专利权人:
KONINKLIJKE PHILIPS N.V.
发明人:
THOMAS KOEHLER,ROGER STEADMAN BOOKER,MATTHIAS SIMON,WALTER RUETTEN,HERFRIED KARL WIECZOREK
申请号:
US16307675
公开号:
US20190304616A1
申请日:
2017.06.08
申请国别(地区):
US
年份:
2019
代理人:
摘要:
The invention relates to an analyzing grid for phase contrast imaging and/or dark-field imaging, a detector arrangement for phase contrast imaging and/or dark-field imaging comprising such analyzing grid, an X-ray imaging system comprising such detector arrangement, a method for manufacturing such analyzing grid, a computer program element for controlling such analyzing grid or detector arrangement for performing such method and a computer readable medium having stored such computer program element. The analyzing grid comprises a number of X-ray converting gratings. The X-ray converting gratings are configured to convert incident X-ray radiation into light or charge. The number of X-ray converting gratings comprises at least a first X-ray converting grating and a second X-ray converting grating. Further, the X-ray converting gratings each comprise an array of grating bars, wherein the grating bars within each X-ray converting grating are arranged mutually displaced from each other in a direction perpendicular to the incident X-ray radiation by a specific displacement pitch. Further, the grating bars of the first X-ray converting grating are arranged mutually displaced from the grating bars of the second X-ray converting grating in the direction perpendicular to the incident X-ray radiation by the displacement pitch divided by the number of X-ray converting gratings.
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