A method for the automated determination of an adjusted setting for signal analysis parameters of an x-ray detector is described. With an embodiment of the method, information relating to the dimensions of the object to be examined, the x-ray attenuation in the object to be examined, the nature of the examination and the examination region of the object to be examined is acquired. Signal analysis parameter values are then determined based on the acquired information. A method for automatically setting signal analysis parameters of an x-ray detector is also described. A facility for determining an adjusted setting for signal analysis parameters of an x-ray detector is also described. An x-ray system is also described.
