DAERR, Heiner,ROESSL, Ewald,MARTENS, Gerhard,VAN STEVENDAAL, Udo,ISTEL, Thomas Detlef
申请号:
IBIB2013/056686
公开号:
WO2014/027333A1
申请日:
2013.08.16
申请国别(地区):
WO
年份:
2014
代理人:
摘要:
The present invention relates to differential phase contrast imaging and the aspects in relation with misalignment. In order to provide differential phase contrast imaging with reduced sensitivity to slight unwanted displacement of the different components in the system, an X-ray imaging system (10) for differential phase contrast imaging is provided that comprises a differential phase contrast setup (12) with an X-ray source (14) and an X-ray detector (16), a processing unit (30) with a data storage, and a grating arrangement (18) comprising a source grating (20), a phase grating (22) and an analyzer grating (24). The source grating is arranged between the X-ray source and the phase grating, and the analyzer grating is arranged between the phase grating and the detector. The differential phase contrast setup is configured to acquire a first image without an object, and to acquire a second image as an actual scan with an object of interest provided in a part of the X-ray beam such that at least one unobstructed sub-portion is provided on the detector. The detector is configured to provide X-ray detection data to the processing unit. The processing unit is configured to store the first image as a reference scan, and to determine current changes of the signal by comparing the respective data in the unobstructed sub-portion of the actual scan of the second image with the respective data in the reference scan. The processing unit is configured to provide a correction signal (44) based on the determined changes.La présente invention concerne limagerie par contraste de phase différentiel et les aspects en rapport avec un défaut dalignement. Pour produire une imagerie par contraste de phase différentiel présentant une sensibilité réduite à un léger déplacement inopiné des différents composants dans le système, linvention propose un système dimagerie par rayons X (10) pour limagerie par contraste de phase différentiel qui comprend une installation à contraste de phase diffé