Defect detection system and defect detection method

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专利权人:

ユニ・チャーム株式会社

发明人:

中野 拓巳

申请号：

JP2011147783

公开号：

JP6043473B2

申请日:

2011.07.01

申请国别(地区):

JP

年份:

2016

代理人:

摘要：

A failure detection system that includes an image processing unit configured to acquire a morphological image illustrating a morphology of the absorbent article after processing of the absorbent article, in each of the plurality of steps, a failure detection unit configured to detect the existence of a failure location of the absorbent article after processing, based on the morphological image acquired by the image processing unit, and an image display unit configured to display an image of the absorbent article after processing, when a failure location of the absorbent article is detected by the failure detection unit.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/