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IMAGING APPARATUS INSPECTION DEVICE
专利权人:
发明人:
申请号:
EP16861831.2
公开号:
EP3243425A1
申请日:
2016.08.29
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
An image pickup apparatus inspection device 6 includes: an image pickup apparatus 1 including an image pickup device 31 inside a first lens barrel 24 an angle-of-view conversion optical member 7 made of a translucent resin member having a predetermined refractive index, and including a first surface 7a and a second surface 7b that is an opposite surface of the first surface 7a, the first surface being configured to closely contact a surface of a distal end lens 21a constituting an optical system of the image pickup apparatus 1, the surface of the distal end lens being exposed outside of the first lens barrel 24 of the image pickup apparatus 1, wherein a thickness from the second surface 7b to the first surface 7a is set to a predetermined dimension a test chart 9 including a chart surface 9f provided so as to closely contact the second surface 7b of the angle-of-view conversion optical member 7, an image of the chart surface 9f being picked up by the image pickup apparatus 1 through the angle-of-view conversion optical member 7 and an illumination instrument 8 that illuminates the chart surface 9f of the test chart 9.
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中国工程科技知识中心
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