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光断層画像化装置及びその干渉信号処理方法
专利权人:
株式会社トプコン
发明人:
山北 博士
申请号:
JP2009289211
公开号:
JP5512254B2
申请日:
2009.12.21
申请国别(地区):
JP
年份:
2014
代理人:
摘要:
An interference signal processing method includes: dividing, into a measuring light beam and a reference light beam, each of a plurality of luminous fluxes which respectively have predetermined wavelength bands different from each other and which are emitted by sweeping the wavelength in the respective predetermined wavelength bands detecting, for each of the luminous fluxes, an interference light signal between the reference light beam and a reflected light beam which is reflected from a measuring object at the time when the plurality of measuring light beams are irradiated onto the measuring object calculating at least phase information of a plurality of detected interference light signals and using, as a reference, the phase of the interference light signal obtained from the luminous flux of a first wavelength band, and of generating a corrected interference light signal by correcting, based on the phase information, the phase of the interference light signals obtained from the luminous fluxes of the plurality of wavelength bands different from the first wavelength band.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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