PROBLEM TO BE SOLVED: To provide a particle accelerator system of short pulse output capable of obtaining high-accuracy pulse output.SOLUTION: A particle accelerator system 10 comprises: a particle accelerator 1 an ion source 2 which makes ion incident to the particle accelerator 1 a high frequency power source 3 which supplies high frequency power to the particle accelerator 1 and an accelerator control device 7 which controls the particle accelerator 1, the ion source 2 and the high frequency power source 3. The particle accelerator system also comprises an emission particle count measuring instrument for measuring the number of particles included in one pulse of an emitted pulse-like particle beam as an integration value for an output period of one pulse. The accelerator control device 7 stores a relationship between the number of particles included in one pulse measured by the emission particle count measuring instrument and a value of a control parameter of the ion source 2 during the measurement by a calibration data table or a function and, based on the stored relationship between the number of particles and the value of the control parameter of the ion source 2, controls the ion source 2 in such a manner that a value of the control parameter of the ion source corresponding to the required number of particles inputted from the outside is provided.SELECTED DRAWING: Figure 1COPYRIGHT: (C)2017,JPO&INPIT【課題】高精度のパルス出力を得ることができる短パルス出力の粒子加速器システムを提供する。【解決手段】粒子加速器1と、粒子加速器1にイオンを入射させるイオン源2と、粒子加速器1に高周波電力を供給する高周波電力源3と、粒子加速器1、イオン源2、および高周波電源3を制御する加速器制御装置7とを備えた粒子加速器システム10において、出射されたパルス状の粒子線の1パルスに含まれる粒子数を該1パルスの出力期間にわたる積分値として測定する出射粒子数測定器を備え、加速器制御装置7は、出射粒子数測定器により測定された1パルスに含まれる粒子数と、該測定時のイオン源2の制御パラメータの値との関係を較正データテーブルまたは関数により記憶しており、記憶された粒子数とイオン源2の制御パラメータの値との関係に基づいて、外部より入力された所要粒子数に対応したイオン源の制御パラメータの値となるようイオン源2を制御する。【選択図】図1
