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Method for inspecting pressure pulse wave sensor and method for manufacturing pressure pulse wave sensor
专利权人:
OMRON HEALTHCARE Co.; Ltd.
发明人:
Noriko Shigihara,Yuki Kato,Masayuki Wakamiya,Toshihiko Ogura
申请号:
US15914711
公开号:
US10136858B2
申请日:
2018.03.07
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A method for inspecting a pressure pulse wave sensor is provided. The sensor chip includes a recess which is recessed in a direction perpendicular to the pressure-sensitive face, and the pressure-sensitive element array is formed in a portion of the sensor chip whose thickness is reduced in the direction due to the recess. The method includes: bonding and fixing the sensor chip onto the substrate so that the recess communicates with atmospheric air through only the through hole of the substrate; connecting a substrate-side terminal portion of the substrate and the chip-side terminal portion through an electrically conductive member; and performing characteristic evaluation on the sensor chip based on a signal outputted from the substrate-side terminal portion in a state in which air is sucked through the through hole of the substrate to thereby apply negative pressure to the pressure-sensitive face.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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