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FOREIGN-MATTER INSPECTION DEVICE AND FOREIGN-MATTER INSPECTION SYSTEM
专利权人:
ISHIDA CO., LTD. ;NISSIN ELECTRONICS CO., LTD.
发明人:
YAEGASHI Takuya,TANAKA Ryo
申请号:
US201615764523
公开号:
US2018313772(A1)
申请日:
2016.09.30
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
A foreign-matter inspection device includes a transporting unit transporting an object to be inspected, an X-ray inspection unit detecting a foreign matter included in the object transported by the transporting unit by using permeability of X-rays, a metal detection unit detecting a foreign matter included in the object transported by the transporting unit by using an interaction between a magnetic field and a metal, a housing accommodating the X-ray inspection unit, the metal detection unit, and at least a part of the transporting unit therein, and a data management unit storing result data of the X-ray inspection unit and result data of the metal detection unit in a storage unit in association with each other.
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