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X-ray anti-scatter grid with varying grid ratio
专利权人:
Scott Hsieh
发明人:
Scott Hsieh
申请号:
US15073909
公开号:
US09993219B2
申请日:
2016.03.18
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A device for estimating scatter in X-ray imaging is described. An anti-scatter grid with varying grid ratio is used in conjunction with an X-ray detector. The anti-scatter grid comprises attenuating lamellae that block scattered radiation. The anti-scatter grid contains regions of lesser or greater scatter rejection efficiency, which can be achieved by variations in the grid ratio. Contrast between these regions can be used to estimate residual scatter content. A method for estimating scatter from this device is further described.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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