1. An x-ray system (101), comprising: an x-ray source (104)； an x-ray detector (105) comprising a plurality of detecting strips (105a) located in a first direction of the x-ray detector (105), each detecting strip (105a) further comprising a plurality of pixels (105p) of the detector (105) located in the second direction of the x-ray detector (105)； a phase diffraction grating (161)； a plurality of diffraction gratings (162) of analyzers containing gaps of diffraction gratings； characterized in that the x-ray source (104) and x-ray detector (105) are configured to perform a scanning movement relative to the object (108) in the first direction to scan the object； 162) analyzers are located between the x-ray source (104) and the x-ray detector (105), each of the plurality of diffraction gratings (162) of the analyzers being located in connection with the corresponding detector a strip (105a), with slits of diffraction gratings located in the second direction, and moreover, the slits of diffraction gratings of diffraction gratings (162) of the analyzers of the detection strips (105a) are offset one from another in the second direction. 2. The X-ray diffraction system (101) according to claim 1, characterized in that the displacement of the slots of the diffraction gratings of the diffraction gratings (162) of the analyzers along the plurality of detecting strips (105a) allows sampling over the entire period (163d) of the interference fringes of the interference fringes (163) formed by the phase diffraction grating and displaced due to the phase gradient in the object (108) when the object (108) scan1. Рентгенографическая система (101), содержащая:рентгеновский источник (104)；рентгеновский детектор (105), содержащий множество детектирующих полосок (105a), расположенных в первом направлении рентгеновского детектора (105), при этом каждая детектирующая полоска (105a) дополнительно содержит множество пикселей (105p) детектора (105), расположенных во втором направлении рент
