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Imaging method and imaging apparatus
专利权人:
キヤノン株式会社
发明人:
野里 宏治
申请号:
JP2012087488
公开号:
JP6021394B2
申请日:
2012.04.06
申请国别(地区):
JP
年份:
2016
代理人:
摘要:
To promptly take a high quality image of an object to be inspected, provided is an imaging method for taking an image of the object to be inspected by irradiating the object to be inspected with measuring light, in which an aberration generated in the object to be inspected is corrected by an aberration correction unit. The method includes the repeatedly performed steps of measuring the aberration generated in the object to be inspected, correcting the aberration by controlling the aberration correction unit in accordance with the measured aberration, and storing, in a storage unit, a control state of the aberration correction unit in association with the measured aberration. The aberration correction unit is controlled in a predetermined control state stored in the storage unit.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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