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X-ray tomographic inspection system for the identification of specific target items
专利权人:
Rapiscan Systems; Inc.
发明人:
Edward James Morton
申请号:
US14848176
公开号:
US09606259B2
申请日:
2015.09.08
申请国别(地区):
US
年份:
2017
代理人:
摘要:
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening.
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