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CHARGED PARTICLE BEAM SCANNING USING DEFORMED HIGH GRADIENT INSULATOR
专利权人:
Lawrence Livermore National Security; LLC
发明人:
Yu-Jiuan Chen
申请号:
US13705084
公开号:
US20130140468A1
申请日:
2012.12.04
申请国别(地区):
US
年份:
2013
代理人:
摘要:
Devices and methods are provided to allow rapid deflection of a charged particle beam. The disclosed devices can, for example, be used as part of a hadron therapy system to allow scanning of a target area within a patients body. The disclosed charged particle beam deflectors include a dielectric wall accelerator (DWA) with a hollow center and a dielectric wall that is substantially parallel to a z-axis that runs through the hollow center. The dielectric wall includes one or more deformed high gradient insulators (HGIs) that are configured to produce an electric field with an component in a direction perpendicular to the z-axis. A control component is also provided to establish the electric field component in the direction perpendicular to the z-axis and to control deflection of a charged particle beam in the direction perpendicular to the z-axis as the charged particle beam travels through the hollow center of the DWA.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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