GE Intelligent Platforms; Inc.;GE Intelligent Platforms, Inc.
发明人:
WEGERICH Stephan W.,XU Xaio
申请号：
SI200332525
公开号：
SI1579288T1
申请日:
2003.11.03
申请国别(地区):
SI
年份:
2017
代理人:
摘要：
Reference data observations for given system are used to develop a reference set of such observations. Subsequent observations (comprising, in one embodiment, current observations) are then used to facilitate selection of portions of this reference set to yield a resultant set of observations that serves as a model. This model can then be used in comparison to actual system performance to detect, for example, a trend towards a faulty condition. Pursuant to a preferred approach, the model is recomputed from time to time and, pursuant to a particular embodiment, is recomputed with each new set of current observations.
