您的位置: 首页 > 农业专利 > 详情页

Charged-particle beam irradiation device, charged-particle beam irradiation method, and computer readable medium
专利权人:
SUMITOMO HEAVY INDUSTRIES; LTD.
发明人:
TACHIBANA, MASANORI
申请号:
TW100128678
公开号:
TWI467596B
申请日:
2011.08.11
申请国别(地区):
TW
年份:
2015
代理人:
摘要:
A charged-particle beam irradiation device, which irradiates an object to be irradiated with a charged-particle beam, includes a scanning member that scans the object to be irradiated with the charged-particle beam an irradiation amount setting unit that sets an irradiation amount of the charged-particle beam at a plurality of target scanning positions on a scanning line of the charged-particle beam with which the scanning member scans the object to be irradiated and a scanning speed setting unit that sets a target scanning speed of the charged-particle beam at each of the target scanning positions on the basis of the irradiation amount set by the irradiation amount setting unit.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充