The device, the system and the method of utilizing the signal which is received from the reference section and the sample are offered. Especially, emission at least includes one which faces to the sample 1st electromagnetic emission and one which faces to the reference section 2nd electromagnetic emission at least. Frequency of emission changes with time lapse. It can detect interference, with the 3rd emission of one or more which it is related to 1st electromagnetic emission and the 4th emission of one or more which it is related to 2nd electromagnetic emission. At least concerning one in interfering frequency component obtaining the signal of the specification which it is related with the phase of one or more, to compare with the information of the specification of one or more it is possible the signal of this specification. Furthermore, emission receiving part at least, furthermore it is possible, because of this, it can calibrate the signal of the aforementioned specification to offer another emission, on the basis of the additional signal.< Selective figure >Figure 1C参照部及びサンプルから受けた信号を利用する装置、システム及び方法を提供する。特に、放射は、サンプルに向かう少なくとも1つの第1電磁放射及び参照部に向かう少なくとも1つの第2電磁放射を含む。放射の周波数は、時間経過とともに変化する。干渉は、第1電磁放射に関連した1つ以上の第3放射と、第2電磁放射に関連した1つ以上の第4放射との間で検出できる。干渉における少なくとも1つの周波数成分についての1つ以上位相と関連した特定の信号を得て、この特定の信号を、1つ以上の特定の情報と比較することができる。更に、放射の少なくとも一部を受けて、更に別の放射を提供することができ、これにより、前記特定の信号を追加的な信号に基づいて較正できる。【選択図】図1C
