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微波成像系統及其控制方法
专利权人:
METAL INDUSTRIES RESEARCH &DEVELOPMENT CENTRE
发明人:
YANG, SZU HUA,杨思华,楊思華,HUNG, CHENG YUAN,洪政源,WENG, MIN HANG,翁敏航,YU, TSUNG CHIH,尤崇智,HSU, CHE CHANG,许哲彰,許哲彰
申请号:
TW103142682
公开号:
TWI597052B
申请日:
2014.12.08
申请国别(地区):
TW
年份:
2017
代理人:
摘要:
This invention discloses a microwave imaging system and control method thereof to solve a problem of the known microwave imaging technology incapable of scanning objects rapid. The microwave imaging system comprises at least one transmitting unit, at least one receiving unit, a plurality of switching units, an analysis unit and a control unit. The transmitting unit is used for transmitting microwave to a to-be-test object. The receiving unit is coupled to the transmitting unit and able to move along a track for receiving microwave transmitted from the to-be-test object. The switching units are connected electrically to the transmitting unit and the receiving unit. The analysis unit is connected electrically to the switching units. The control unit is connected electrically to the transmitting unit, the receiving unit, the switching unit and the analysis unit for control the operating status of them, and to generate a transaction image of the to-be-test object. Thus, it can actually resolve the said problem.本發明揭示一種微波成像系統及其控制方法,用於解決習知微波成像無法快速掃瞄物體之問題,該微波成像系統包含至少一發射單元,用以發射微波至一待測物;至少一接收單元,耦接該發射單元,該接收單元能夠沿一軌道移動,用以接收該待測物發出之微波;數個切換單元,電性連接該發射單元及該接收單元;一分析單元,電性連接該切換單元;及一控制單元,電性連接該發射單元、該接收單元、該切換單元及該分析單元,用以控制該發射單元、該接收單元、該切換單元及該分析單元之運作,以及,產生該待測物的橫切面影像。藉此,可確實解決上述問題。
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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