Zhongmin Steve Lin,Gopal Avinash,Saad Sirohey,Ananth Mohan,Satoshi Minoshima
申请号：
US12324498
公开号：
US09008394B2
申请日:
2008.11.26
申请国别(地区):
US
年份:
2015
代理人:
摘要：
Methods and apparatus for determining brain cortical thickness are provided. One method includes determining an intensity profile at each of a plurality of cortical surface points of an imaged brain using brain tissue image data and calculating a cortical thickness based on a parametrically determined transition point of each intensity profile.
