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表面平滑性に優れた多孔質シリカ系粒子および該多孔質シリカ系粒子を配合してなる化粧料
专利权人:
日揮触媒化成株式会社
发明人:
榎本 直幸,三好 康敬,川島 庸男,宮崎 巧
申请号:
JP2014173656
公开号:
JP5791771B2
申请日:
2014.08.28
申请国别(地区):
JP
年份:
2015
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide porous silica based particles having excellent surface smoothness, and a cosmetic obtained by being blended with the porous silica based particles.SOLUTION: Provided is porous silica based particles in which the average particle diameter lies in the range of 0.5 to 30 μm, and having surface smoothness in such a manner that the number of micro-particles present per μm2 of the plane obtained by capturing the whole surfaces of the particles with a scanning type electron microscope (SEM microscope) of 10,000 magnifications is 5 pieces or lower, and, when a difference between a circumscribed circle and an inscribed circle in the particle boundaries of the particles is measured with a photograph (TEM photograph) obtained by capturing the cross-sections of the porous silica based particles with a transmission electron microscope of 100,000 magnifications, and provided that the value is defined as a surface roughness value, the surface roughness value of the particles is 20 nm, the non-sphericity of the particles is 5% or lower, the particle variation coefficient (CV value) of the particles lies in the range of 5 to 50%, and the specific surface area of the porous silica based particles lies in the range of 97 to 320 m2/g. Also provided is a cosmetic obtained by being blended with the porous silica based particles.COPYRIGHT: (C)2015,JPO&INPIT【課題】本発明は、表面平滑性に優れた多孔質シリカ系粒子および該多孔質シリカ系粒子を配合してなる化粧料に関するものである。【解決手段】平均粒子径が0.5~30μmの範囲にある多孔質シリカ系粒子であって、該粒子の全体表面を10000倍の走査型電子顕微鏡で撮った写真(SEM写真)で捉えた平面1μm2当たりに存在する極小微粒子が5個以下である表面平滑性を備え、前記多孔質シリカ系粒子の断面を100000倍の透過型電子顕微鏡で撮った写真(TEM写真)より、該粒子の粒界における外接円と内接円との差を測定し、その値を表面粗さ値としたとき、該粒子の表面粗さ値が20nm以下であり、該粒子の非真球率が、5%以下であり、該粒子の粒子変動係数(CV値)が、5~50%の範囲にあり、前記多孔質シリカ系粒子の比表面積が97~320m2/gの範囲にある多孔質シリカ系粒子および該多孔質シリカ系粒子を配合してなる化粧料。【選択図】図4
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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