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СИСТЕМА ДАТЧИКОВ
专利权人:
КОНИНКЛЕЙКЕ ФИЛИПС ЭЛЕКТРОНИКС Н.В. (NL)
发明人:
БРЮКЕРС Альфонс Антониус Мария Ламбертус (NL),БРЕБАРТ Дирк Ерун (NL),БУГОРБЕЛЬ Сабри (NL)
申请号:
RU2012131357/14
公开号:
RU2012131357A
申请日:
2010.12.16
申请国别(地区):
RU
年份:
2014
代理人:
摘要:
1. A system (100, 400) sensor comprising an array (110) of sensors, wherein the array (110) comprises a sensor layer (120) substrate and a plurality of individual first elements (130) sensors for measuring a desired parameter, the first elements (130) of which sensors arranged on said layer (120) of the substrate and define a plane (140) of sensors, wherein the array (110) of sensors further comprises one or more second elements (200, 210) sensors for measuring additional desired parameter, wherein the system (100, 400) sensors adapted to process DATA x from the sensors of the first elements (130) of sensors depending on sensor data from one or more second elements (200, 210) of sensors, and wherein the system (100, 400) of sensors is configured to use sensor data from one or more second elements (200, 210) sensors to determine which sensor data from the first element (130) proignorirovany.2 sensors. The system (100, 400) sensors according to claim. 1, wherein the system (100, 400) of sensors is configured to use sensor data from one or more second elements (200, 210) sensors for calibrating sensor data from the first elements (130 datchikov.3). The system (100, 400) sensors according to claim. 1, comprising a control unit (170) to the first input (171) for receiving data from the sensors of the first elements (130) of sensors and the second input (173) for receiving data from the sensors of the second elements (200, 210) sensor, and the output (172) to provide data on the basis of an output signal from the first sensor elements (130) of sensors depending on the data from the sensors of one or more second elements (200, 210) datchikov.4. The system (100, 400) agrees sensors1. Система (100, 400) датчиков, содержащая массив (110) датчиков, причем массив (110) датчиков содержит слой (120) подложки и множество индивидуальных первых элементов (130) датчиков для измерения желаемого параметра, первые элементы (130) датчиков которого скомпонованы на указанном слое (120) под
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