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GAIT ASYMMETRY MEASUREMENT
专利权人:
Patrick Esser
发明人:
Patrick Esser,Ken Howells,Helen Dawes,Johnny Collet
申请号:
US14122344
公开号:
US20140114214A1
申请日:
2012.05.25
申请国别(地区):
US
年份:
2014
代理人:
摘要:
A system for measuring variation in the gait of a subject comprises a sensor arranged to measure variations in vertical position of the subject while the subject takes a series of steps, a processor, and a display. The processor is arranged to identify a plurality of points in a first one of the steps and a plurality of points in a second one of the steps, to identify a plurality of pairs of the points, each pair comprising one point in each of the steps, to determine a value of height for each of the points in each of the pairs, and to control the display to produce a display plotting the heights of the two points in each pair against each other.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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