半導体検出器の補間装置及びその方法
- 专利权人:
- 株式会社東芝
- 发明人:
- 金田 明義,上島 茂
- 申请号：
- JP2006286988
- 公开号：
- JP5049547B2
- 申请日:
- 2006.10.20
- 申请国别(地区):
- JP
- 年份:
- 2012
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To more effectively use a current pixel type semiconductor device.
SOLUTION: Each of energy signals e
1 outputted from pixel type semiconductor devices 1a of a semiconductor detector 1 is analyzed by a pixel energy spectrum analysis device 3 to obtain each of pixel values, the pixel values are sorted into first to third classes C1 , C2 , C3 , for example, corresponding to degrees of performance of the pixel type semiconductor devices 1a by a shorter 4. Values of an attention pixel of the second class C2 and a defect pixel of the third class C3 , for example, sorted as low-performance pixels of the pixel type semiconductor devices 2a are interpolated by an interpolation processing device 6, respectively.COPYRIGHT: (C)2008,JPO&INPIT
- 来源网站：
- 中国工程科技知识中心
