半導体検出器の補間装置及びその方法

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专利权人:

株式会社東芝

发明人:

金田 明義,上島 茂

申请号：

JP2006286988

公开号：

JP5049547B2

申请日:

2006.10.20

申请国别(地区):

JP

年份:

2012

代理人:

摘要：

PROBLEM TO BE SOLVED: To more effectively use a current pixel type semiconductor device.

SOLUTION: Each of energy signals e1outputted from pixel type semiconductor devices 1a of a semiconductor detector 1 is analyzed by a pixel energy spectrum analysis device 3 to obtain each of pixel values, the pixel values are sorted into first to third classes C1, C2, C3, for example, corresponding to degrees of performance of the pixel type semiconductor devices 1a by a shorter 4. Values of an attention pixel of the second class C2and a defect pixel of the third class C3, for example, sorted as low-performance pixels of the pixel type semiconductor devices 2a are interpolated by an interpolation processing device 6, respectively.

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