A method and an apparatus (700) for analyzing a component of an object (OBJ) are provided. The apparatus includes an image sensor (100, 710) including at least one optical module (711), and the optical module (711) includes a light source (111) configured to emit a source light, a first detector (112) configured to detect a first light that is scattered or reflected from the object (OBJ) on which the emitted source light is incident, and a second detector (113) configured to detect a second light that is emitted by the light source (111) but is not incident on the object (OBJ). The apparatus (700) further includes a processor (720) configured to calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light, and analyze the component of the object (OBJ), based on the calculated scattering coefficient and the calculated absorption coefficient. Image distortion caused by light source drift may be prevented. Preferably the image sensor (100, 710) is formed to have a predetermined network structure, such that optical modules (711) are disposed one by one at each node of a substrate (120) having a network structure.
