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APPAREIL DE MESURE DU POTENTIEL ÉVOQUÉ
专利权人:
Nihon Kohden Corporation
发明人:
申请号:
EP17156848.8
公开号:
EP3210532A1
申请日:
2017.02.20
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
An evoked potential measuring apparatus includes: an evoked potential acquiring section which is configured to acquire a plurality of evoked potential waveforms from a subj ect in response to stimulation; an average processing section which is configured to arithmetically average the plurality of evoked potential waveforms to acquire an average waveform; a first statistical value calculator which, each time a waveform set including an N (N is 2 or more) number of evoked potential waveforms is acquired, is configured to calculate a first statistical value of the waveform set; and an updation processing section which is configured to update the average waveform to eliminate a waveform set in which the first statistical value exceeds a first threshold, from the arithmetic average.
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中国工程科技知识中心
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