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X-RAY PHASE-CONTRAST AND DARK-FIELD INFORMATION EXTRACTION WITH ELECTRIC FRINGE SCANNING AND/OR ACTIVE PIXEL PROCESSING
专利权人:
Rensselaer Polytechnic Institute;University of Central Florida
发明人:
Ge Wang,Wenxiang Cong,Zaifeng Shi,Shuo Pang
申请号:
US15741026
公开号:
US20180192980A1
申请日:
2016.07.20
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Novel and advantageous systems and methods for performing X-ray imaging by extracting X-ray phase-shift and/or dark-field information through a detector that has built-in G2 functionality are provided. Grating translation can be replaced by an electrical operation in the detection procedure, thereby eliminating the need for the analyzer grating and the typical mechanical stepping process.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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