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METHOD AND SYSTEM FOR ANALYZING A SAMPLE MATERIAL
专利权人:
thyssenkrupp Industrial Solutions AG;thyssenkrupp AG
发明人:
TEUTENBERG, Reinhard,SCHNEBERGER, Jürgen,BORNEFELD, Marc,MAIER, Oliver
申请号:
EP20160822668
公开号:
EP3394611(A1)
申请日:
2016.12.20
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
The invention relates to a method for analyzing a sample material, wherein the sample material is ground, formed into a tablet, optionally processed, and then analyzed. Said method is characterized in that the analysis is performed by means of laser emission spectroscopy. A system suitable for performing such a method comprises at least a mill for grinding the sample material, a device for forming a tablet from the ground sample material, preferably a tablet press, and a device for analyzing the sample material by means of laser emission spectroscopy.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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