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CAPACITIVE MICROMACHINED ULTRASONIC TRANSDUCER PROBE USING WIRE-BONDING
专利权人:
SAMSUNG ELECTRONICS CO.; LTD.
发明人:
Sungchan KANG,Byunggil JEONG,Sangha PARK,Hyungjae SHIN
申请号:
US14728341
公开号:
US20160007959A1
申请日:
2015.06.02
申请国别(地区):
US
年份:
2016
代理人:
摘要:
Provided are capacitive micromachined ultrasonic transducer (CMUT) probes that use wire bonding. A CMUT probe includes a CMUT chip which includes a plurality of first electrode pads which are disposed on a first surface thereof, a printed circuit board (PCB) which is disposed on the first surface of the CMUT chip and which is configured to expose the plurality of first electrode pads, a plurality of second electrode pads which are disposed on the PCB and which correspond to respective ones of the plurality of first electrode pads, and a plurality of wires which connect each respective one of the plurality of first electrode pads to the corresponding one of the plurality of second electrode pads.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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