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Testing tuned circuits
专利权人:
Bill Metzenthen
发明人:
Bill Metzenthen
申请号:
US13553798
公开号:
US09571166B2
申请日:
2012.07.19
申请国别(地区):
US
年份:
2017
代理人:
摘要:
Methods and systems for determining one or more parameters of a tuned circuit forming part of a wireless energy transmission system in an implanted (or implantable) medical device are described. The method involves energizing the tuned circuit then receiving a signal back from it. This signal is then analyzed to determine a property of the circuit such as its quality factor (Q) or resonant frequency. Also described herein is a method and system for determining the implantation depth of a component of an implanted medical device. The method involves determining the position of a magnetic element which is mounted in a fixed physical relationship with the component of the medical device. The methods can be performed on an implanted medical device without the need to explant the device.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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