A reduction in the inspection accuracy of an inspection system, caused by stray light, is prevented. Provided is an inspection chip for use in an inspection system that detects a subject captured by immunoreaction, the inspection chip including an optical measurement chip having, on a top surface, a reaction field formation surface on which a reaction field for allowing the immunoreaction to occur is formed, and including a prism having a reflected light emission surface that emits reflected light reflected by the reaction field formation surface; and a cartridge in which at least one well that stores a liquid including the subject is formed; wherein the cartridge is not located in a region where a first space and a second space are overlapped under the predetermined assumption.
