This invention relates to an optical probe (200) and an optical imaging system, including an optical guide (201) having a proximal end and a distal end, an actuation means having driving coils (204) and a magnet, with of which being attached to the optical guide. By supplying a driving current through the driving coils a magnetic flux is generated which interacts with the magnet forming a driving force acting at on the optical guide causing a displacement of the distal end of the optical guide. A position measuring including a position measuring coil (205) is used for monitoring the position of the optical guide, where the internal arrangement of the position measuring coil and the driving coils is such that said displacement of the distal end of the optical guide causes a change in the internal arrangement. A power supply supplies an additional high frequency alternating current (AC) through the driving coils which causes an induced voltage in the position measuring coil and thus generates a magnetic coupling between the position measuring coil and the driving coils. A position measuring means measures the displacement of the distal end of the optical guide by means of measuring the induced voltage resulting in when the internal arrangement changes. This induced voltage change being indicative for the position of the distal end.La présente invention concerne une sonde optique (200) et un système dimagerie optique, incluant un guide optique (201) qui présente une extrémité proximale et une extrémité distale, un moyen dactionnement avec des bobines dentraînement (204) et un aimant étant fixé au guide optique. Lapport dun courant de commande à travers les bobines dentraînement permet de produire un flux magnétique qui interagit avec laimant, formant une force motrice qui agit sur le guide optique et provoque un déplacement de lextrémité distale dudit guide optique. Un système de mesure de position incluant une bobine de mesure de position (205) est utilisé afin de sur
