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USE OF ETCH RESIST MASKED ANODE FRAME FOR FACILITATION OF LASER CUTTING, PARTICLE AND LEAKAGE CURRENT REDUCTION
专利权人:
发明人:
Thomas F. Strange,Ralph Jason Hemphill,David R. Bowen,Kurt J. Erickson
申请号:
US16112353
公开号:
US20180366276A1
申请日:
2018.08.24
申请国别(地区):
US
年份:
2018
代理人:
摘要:
The present invention is directed to a method of etching anode foil in a non-uniform manner which minimizes thermal oxidation during foil cutting. Having less oxide improves the ability to cut through aluminum anodes with lower energy rates. In aluminum foils, it has been found that a masking step before etching reduces conversion of boehmite aluminum oxide to alpha-phase corundum during laser cutting of anodes, which increases edge quality and productivity. Additionally, the non-etched anode frame allows for less surface area to form during the aging process. As a result, the leakage current is reduced by the proportion of edge to anode surface area, and the aging process will be faster, leading to higher productivity.
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