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SYSTEMES ET METHODES D'UN MODELE D'ETALONNAGE ET DE COMPENSATION DE PERTE D'IMPEDANCE PREDICTIVE
专利权人:
COVIDIEN LP
发明人:
HECKEL, DONALD W.
申请号:
CA2801396
公开号:
CA2801396A1
申请日:
2013.01.09
申请国别(地区):
CA
年份:
2013
代理人:
摘要:
The systems and methods of the present disclosure calibrate impedance lossmodelparameters associated with an electrosurgical system having no externalcabling or havingexternal cabling with a fixed or known reactance, and obtain accurateelectricalmeasurements of a tissue site by compensating for impedance losses associatedwith thetransmission line of an electrosurgical device using the calibrated impedanceloss modelparameters. A computer system stores voltage and current sensor data for arange ofdifferent test loads and calculates sensed impedance values for each testload. The computersystem then predicts a phase value for each load using each respective loadimpedance value.The computer system back calculates impedance loss model parameters includinga sourceimpedance parameter and a leakage impedance parameter based upon the voltageand currentsensor data, the predicted phase values, and the impedance values of the testloads. Duringoperation, the electrosurgical device senses a voltage and a current, predictsa phase valuebased upon the sensed voltage and current, and calculates metrics at thetissue site basedupon the sensed voltage and current, the predicted phase value, the sourceimpedanceparameter, and the leakage impedance parameter.
来源网站:
中国工程科技知识中心
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