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Fast absolute-reflectance method for the determination of tear film lipid layer thickness
专利权人:
发明人:
Stanley W. Huth,Denise Tran
申请号:
US14831678
公开号:
US09681802B2
申请日:
2015.08.20
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A method for determining reflectivity of a tear film lipid layer of a patient and recommending a course of treatment based on the same. The method includes the steps of: measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength-dependent optical interferometer converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum comparing the calculated absolute reflectance spectrum to a theoretical absolute lipid reflectance spectrum to determine a tear film lipid layer thickness and determining a reflectivity value for the tear film lipid layer thickness at a first wavelength of light corresponding to ultraviolet, violet, or blue light.
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