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超音波探触子及び超音波診断装置
专利权人:
株式会社日立メディコ
发明人:
浅房 勝徳,深田 慎
申请号:
JP2009522584
公开号:
JP5329408B2
申请日:
2008.07.01
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
Provided are an ultrasonic probe and an ultrasonic diagnostic apparatus, which reduction parastic impedances which occurs in upper electrodes and lower electrodes and thereby reducing cross talk. The ultrasonic probe comprises a cMUT chip (20) having a plurality of transducer elements and an acoustic lens (26) ON the ultrasonic wave irradiation side of the cMUT chip (20), a backing layer (22) ON the back of the cMUT chip (20), and wires connected with the cMUT chip (20). This cMUT chip (20) includes a plurality of upper electrodes (46) and a plurality of lower electrodes (48), and these lower electrodes (48) are connected at two or more portions with wires.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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