Integrated circuit and measuring apparatus

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专利权人:

シャープ株式会社

发明人:

増田 亮一,河西 秀典

申请号：

JP2017514054

公开号：

JP6395169B2

申请日:

2016.04.05

申请国别(地区):

JP

年份:

2018

代理人:

摘要：

An integrated circuit includes a first detection element that detects a temperature of an object based on infrared light reflected from the object and a second detection element that detects an image of the object based on visible light reflected from the object on the same substrate.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/