Tokyo Metropolitan Industrial Technology Research Institute
发明人:
Akira Monkawa,Shoichi Nakanishi,Shinya Abe
申请号：
US15579672
公开号：
US10520453B2
申请日:
2016.06.03
申请国别(地区):
US
年份:
2019
代理人:
摘要：
Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy. An image acquisition device 1 includes: a first X-ray source 10 that applies X-rays having a first focal point size； a first detector 20 that detects X-rays applied from the first X-ray source 10 and having passed through a measured object O； a first image generation means 30 that generates a first X-ray CT image on the basis of the X-rays detected by the first detector 20； a second X-ray source 40 that applies X-rays having a second focal point size smaller than the first focal point size； a second detector 50 that detects X-rays applied from the second X-ray source and having passed through the measured object O； a second image generation means 60 that generates a second X-ray CT image on the basis of the X-rays detected by the second detector 50； and an image correction means 70 that corrects the first X-ray CT image generated by the first image generation means 30 on the basis of the second X-ray CT image generated by the second image generation means 60.
