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X-RAY EXAMINATION ARRANGEMENT AND METHOD FOR OPERATING AN X-RAY EXAMINATION ARRANGEMENT
专利权人:
Carl Zeiss lndustrielle Messtechnik GmbH
发明人:
Marco Erler,Daniel Weiss,Martin Krenkel,Wolfgang Kimmig
申请号:
US16798348
公开号:
US20200268326A1
申请日:
2020.02.22
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An x-ray examination arrangement includes an x-ray radiation source arranged at a source position, at least two x-ray detectors having active detector areas and being arranged such that the active detector areas capture different solid angle ranges with respect to x-ray radiation produced by the x-ray radiation source and emanating from the source position, and a control device configured to calculate a projection onto a virtual detector plane based on radiographs respectively captured by the at least two x-ray detectors and spatial poses of the at least two x-ray detectors relative to the source position, and provide a combined radiograph for the virtual detector plane based on the projection. In addition, a method for operating the x-ray examination arrangement and a computed tomography device are provided.
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http://www.ckcest.cn/home/
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